ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,112, issued on April 7, was assigned to NEC Corp. (Tokyo). "Inspection device, inspection method, and recording medium" was invented by Shi... और पढ़ें
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,113, issued on April 7, was assigned to Hangzhou Dianzi University (Hangzhou City, China). "Fabric defect detection method" was invented by... और पढ़ें
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,114, issued on April 7, was assigned to ACV Auctions Inc. (Buffalo, N.Y.). "Systems and techniques for vehicle inspection and condition ana... और पढ़ें
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,115, issued on April 7, was assigned to ACV Auctions Inc. (Buffalo, N.Y.). "Systems and techniques for vehicle inspection and condition ana... और पढ़ें
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,116, issued on April 7, was assigned to International Business Machines Corp. (Armonk, N.Y.). "Automatic detection of mask defects in semic... और पढ़ें
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,117, issued on April 7, was assigned to TOYO SEIKAN Co. LTD. (Tokyo). "Method, program, apparatus, and system for abnormality detection suc... और पढ़ें
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,118, issued on April 7, was assigned to KONICA MINOLTA INC. (Tokyo). "Image inspection apparatus, image inspection method, and image inspec... और पढ़ें
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,119, issued on April 7, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Gyeonggi-do, South Korea). "Operating method of electronic device inc... और पढ़ें
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,120, issued on April 7, was assigned to Seiko Epson Corp. (Tokyo). "Printed image defect discrimination device and method displaying detect... और पढ़ें
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,122, issued on April 7, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Defect detection device and method thereof" ... और पढ़ें